Recomienda este artículo a tus amigos:
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Lawrence C Wagner 1999 edition
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science
Lawrence C Wagner
This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.
255 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de enero de 1999 |
| ISBN13 | 9780412145612 |
| Editores | Chapman and Hall |
| Páginas | 255 |
| Dimensiones | 155 × 235 × 17 mm · 589 g |
| Lengua | Inglés |
| Editor | Wagner, Lawrence C. |