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Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM Nobuo Tanaka Second Edition 2024 edition
Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM
Nobuo Tanaka
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 3 de agosto de 2024 |
| ISBN13 | 9784431569398 |
| Editores | Springer Verlag, Japan |
| Páginas | 384 |
| Dimensiones | 150 × 220 × 20 mm · 839 g |