A Benninghoven
Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics A Benninghoven Softcover reprint of the original 1st ed. 1982 edition

Name: Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics
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Author: A Benninghoven

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Secondary Ion Mass Spectrometry SIMS III: Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30-September 5, 1981 - Springer Series in Chemical Physics

A Benninghoven

Softcover reprint of the original 1st ed. 1982 edition

Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.

458 pages, biography

Medios de comunicación	Libros Paperback Book (Libro con tapa blanda y lomo encolado)
Publicado	26 de julio de 2012
ISBN13	9783642881541
Editores	Springer-Verlag Berlin and Heidelberg Gm
Páginas	447
Dimensiones	155 × 235 × 24 mm · 639 g
Lengua	Alemán
Editor	Benninghoven, A.
Editor	Giber, J.
Editor	Laszlo, J.
Editor	Riedel, M.
Editor	Werner, H.W.