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Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science Johann-Martin Spaeth Softcover reprint of the original 1st ed. 2003 edition
Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science
Johann-Martin Spaeth
The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago.
492 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 14 de septiembre de 2012 |
| ISBN13 | 9783642627224 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 492 |
| Dimensiones | 155 × 235 × 25 mm · 703 g |
| Lengua | Inglés |
| Colaborador | Hans-Joachim Queisser |
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