Stefan Rein
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science Stefan Rein Softcover reprint of hardcover 1st ed. 2005 edition

Name: Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science
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Author: Stefan Rein

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Hardcover Book

2005 edition

(2005) $ 312,99

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications - Springer Series in Materials Science

Stefan Rein

Softcover reprint of hardcover 1st ed. 2005 edition

Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

492 pages, 29 black & white tables, biography

Medios de comunicación	Libros Paperback Book (Libro con tapa blanda y lomo encolado)
Publicado	19 de octubre de 2010
ISBN13	9783642064531
Editores	Springer-Verlag Berlin and Heidelberg Gm
Páginas	492
Dimensiones	155 × 235 × 26 mm · 721 g
Lengua	Inglés