Defect Detection Via Thz Imaging: Potentials and Limitations: a Brief History of Thz Imaging - Kaveh Houshmand - Libros - VDM Verlag Dr. Müller - 9783639103694 - 6 de noviembre de 2008
En caso de que portada y título no coincidan, el título será el correcto

Defect Detection Via Thz Imaging: Potentials and Limitations: a Brief History of Thz Imaging

Precio
$ 57,49
sin IVA

Pedido desde almacén remoto

Entrega prevista 17 de jun. - 6 de jul.
Añadir a tu lista de deseos de iMusic

Until recent years, terahertz waves were an undiscovered, or most importantly, an unexploited area of electromagnetic spectrum. Recent advances in hardware have started to open up the ¿eld to new applications such as THz imaging. This non destructive technology can penetrate through diverse material such that the internal structure which is invisible to other imaging modalities, can be visualized. However, automated processing of THz images can be quite challenging. Low contrast and the presence of a widely unknown type of noise make the analysis of these images difficult. Therefore, pre-processing techniques are required for further investigations.

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 6 de noviembre de 2008
ISBN13 9783639103694
Editores VDM Verlag Dr. Müller
Páginas 88
Dimensiones 150 × 220 × 10 mm   ·   127 g
Lengua Inglés   Alemán  

Mere med samme udgiver