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Fundamentals of Electromigration-Aware Integrated Circuit Design Jens Lienig 2018 edition
Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
159 pages, 95 Illustrations, color; 4 Illustrations, black and white; XIII, 159 p. 99 illus., 95 ill
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 7 de marzo de 2018 |
| ISBN13 | 9783319735573 |
| Editores | Springer International Publishing AG |
| Páginas | 159 |
| Dimensiones | 241 × 166 × 12 mm · 434 g |
| Lengua | Alemán |
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