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Fundamentals of Electromigration-Aware Integrated Circuit Design Jens Lienig Second Edition 2025 edition
Fundamentals of Electromigration-Aware Integrated Circuit Design
Jens Lienig
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 26 de febrero de 2025 |
| ISBN13 | 9783031800221 |
| Editores | Springer International Publishing AG |
| Páginas | 167 |
| Dimensiones | 150 × 220 × 20 mm · 479 g |
| Lengua | Alemán |
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