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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences Softcover Reprint of the Original 1st 2018 edition
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization - Springer Series in Surface Sciences
521 pages, 40 Tables, color; 194 Illustrations, color; 40 Illustrations, black and white; XXIV, 521
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 4 de enero de 2019 |
| ISBN13 | 9783030092986 |
| Editores | Springer Nature Switzerland AG |
| Páginas | 521 |
| Dimensiones | 150 × 220 × 10 mm · 757 g |
| Lengua | Alemán |
| Editor | Glatzel, Thilo |
| Editor | Sadewasser, Sascha |