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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems Tomi Laurila 2012 edition
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems
Tomi Laurila
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
218 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 22 de febrero de 2014 |
| ISBN13 | 9781447160687 |
| Editores | Springer London Ltd |
| Páginas | 218 |
| Dimensiones | 155 × 235 × 15 mm · 317 g |
| Lengua | Inglés |