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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems Tomi Laurila 2012 edition
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach - Microsystems
Tomi Laurila
This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
240 pages, 113 black & white illustrations, 15 colour illustrations, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 13 de enero de 2012 |
| ISBN13 | 9781447124696 |
| Editores | Springer London Ltd |
| Páginas | 218 |
| Dimensiones | 155 × 235 × 18 mm · 453 g |
| Lengua | Inglés |