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CTL for Test Information of Digital ICs Rohit Kapur 2002 edition
CTL for Test Information of Digital ICs
Rohit Kapur
From the reviews: "[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields." Microelectronics Reliability
173 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de octubre de 2002 |
| ISBN13 | 9781402072932 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 173 |
| Dimensiones | 155 × 235 × 12 mm · 439 g |
| Lengua | Inglés |