Recomienda este artículo a tus amigos:
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering ZhiLi, Dong (Nanyang Technological University, Singapore)
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering
ZhiLi, Dong (Nanyang Technological University, Singapore)
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 27 de noviembre de 2025 |
| ISBN13 | 9781032246802 |
| Editores | Taylor & Francis Ltd |
| Páginas | 272 |
| Dimensiones | 150 × 220 × 10 mm · 500 g |
| Lengua | Inglés |