Recomienda este artículo a tus amigos:
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering ZhiLi, Dong (Nanyang Technological University, Singapore)
Precio
$ 163,99
sin IVA
Pedido desde almacén remoto
Entrega prevista 18 de jun. - 7 de jul.
Nuestros clientes opinan:
Añadir a tu lista de deseos de iMusic
También disponible como:
Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists - Advances in Materials Science and Engineering
ZhiLi, Dong (Nanyang Technological University, Singapore)
The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.
272 pages, 105 Line drawings, black and white; 27 Halftones, black and white; 3 Tables, black and wh
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 24 de mayo de 2022 |
| ISBN13 | 9780367357948 |
| Editores | Taylor & Francis Ltd |
| Páginas | 272 |
| Dimensiones | 159 × 241 × 23 mm · 568 g |
| Lengua | Inglés |
