Hisham Haddara
Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Hisham Haddara 1995 edition

Name: Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science
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Author: Hisham Haddara

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Softcover reprint of the original 1st ed. 1995 edition

(2011) $ 158,49

Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science

Hisham Haddara

1995 edition

The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.

232 pages, biography

Medios de comunicación	Libros Hardcover Book (Libro con lomo y cubierta duros)
Publicado	31 de enero de 1996
ISBN13	9780792396956
Editores	Springer
Páginas	232
Dimensiones	155 × 235 × 15 mm · 530 g
Lengua	Inglés
Editor	Haddara, Hisham