Yusuf Leblebici
Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science Yusuf Leblebici 1993 edition

Name: Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science
Price: 236.49 USD
Availability: OutOfStock
Author: Yusuf Leblebici

Precio

$ 236,49

sin IVA

Pedido desde almacén remoto

Entrega prevista 19 de jun. - 8 de jul.

Nuestros clientes opinan:

Top-vurdering på Google Reviews, baseret på tusinder af anmeldelser.

Política de devolución de 14 días conforme a la legislación europea de protección de los consumidores

Mejor valorado en Trustpilot

Añadir a tu lista de deseos de iMusic

También disponible como:

Paperback Book

Softcover Reprint of the Original 1st Ed. 1993 edition

(2012) $ 209,99

Hot-Carrier Reliability of MOS VLSI Circuits - The Springer International Series in Engineering and Computer Science

Yusuf Leblebici

1993 edition

The development and use of accurate reliability simulation tools are therefore crucial for early assessment and improvement of circuit reliability : Once the long-term reliability of the circuit is estimated through simulation, the results can be compared with predetermined reliability specifications or limits.

229 pages, biography

Medios de comunicación	Libros Hardcover Book (Libro con lomo y cubierta duros)
Publicado	30 de junio de 1993
ISBN13	9780792393528
Editores	Springer
Páginas	212
Dimensiones	155 × 235 × 14 mm · 508 g
Lengua	Inglés