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High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology Jon Orloff 2002 edition
High Resolution Focused Ion Beams: Fib and Its Applications: the Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
Jon Orloff
Suitable for both the user and the designer of FIB instrumentation, this book focuses on high resolution focused ion beams (FIBs).
304 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de octubre de 2002 |
| ISBN13 | 9780306473500 |
| Editores | Springer Science+Business Media |
| Páginas | 304 |
| Dimensiones | 155 × 235 × 20 mm · 589 g |
| Lengua | Inglés |