Recomienda este artículo a tus amigos:
Principles of Analytical Electron Microscopy Goldstein Joseph 1986 edition
Principles of Analytical Electron Microscopy
Goldstein Joseph
All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
448 pages, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 31 de julio de 1986 |
| ISBN13 | 9780306423871 |
| Editores | Springer Science+Business Media |
| Páginas | 448 |
| Dimensiones | 156 × 234 × 26 mm · 830 g |
| Lengua | Inglés |
| Editor | Goldstein, Joseph |
| Editor | Joy, David C. |
| Editor | Romig Jr., Alton D. |