VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers - Communications in Computer and Information Science - - Libros - Springer Verlag, Singapore - 9789813297661 - 18 de agosto de 2019
En caso de que portada y título no coincidan, el título será el correcto

VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers - Communications in Computer and Information Science 2019 edition

Precio
$ 115,49
sin IVA

Pedido desde almacén remoto

Entrega prevista 29 de jun. - 10 de jul.

Nuestros clientes opinan:

Política de devolución de 14 días conforme a la legislación europea de protección de los consumidores
Mejor valorado en Trustpilot
Añadir a tu lista de deseos de iMusic

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;

775 pages, 336 Illustrations, color; 209 Illustrations, black and white; XVI, 775 p. 545 illus., 336

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 18 de agosto de 2019
ISBN13 9789813297661
Editores Springer Verlag, Singapore
Páginas 775
Dimensiones 150 × 220 × 10 mm   ·   1,19 kg
Editor Dasgupta, Sudeb
Editor Kumar Vishvakarma, Santosh
Editor Sengupta, Anirban
Editor Sharma, Rohit
Editor Singh, Virendra

Mere med samme udgiver