Recomienda este artículo a tus amigos:
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices - Selected Topics in Electronics and Systems Daniel M. Fleetwood
Pedido desde almacén remoto
Nuestros clientes opinan:
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices - Selected Topics in Electronics and Systems
Daniel M. Fleetwood
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
348 pages, Illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 3 de agosto de 2004 |
| ISBN13 | 9789812389404 |
| Editores | World Scientific Publishing Co Pte Ltd |
| Páginas | 348 |
| Dimensiones | 168 × 249 × 23 mm · 680 g |
| Lengua | Inglés |
| Editor | Fleetwood, Daniel M (Vanderbilt Univ, Usa) |
| Editor | Schrimpf, Ronald D (Vanderbilt Univ, Usa) |
