Recomienda este artículo a tus amigos:
Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics 2018 edition
Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 14 de septiembre de 2018 |
| ISBN13 | 9789811304538 |
| Editores | Springer Verlag, Singapore |
| Páginas | 508 |
| Dimensiones | 150 × 220 × 20 mm · 898 g |
| Editor | Bai, Xuedong |
| Editor | Tao, Jing |
| Editor | Wang, Chen |
| Editor | Wang, Rongming |
| Editor | Zhang, Hongzhou |