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Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics 1st ed. 2017 edition
Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.
241 pages, 126 black & white illustrations, 25 colour illustrations, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 5 de enero de 2017 |
| ISBN13 | 9783662532256 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 241 |
| Dimensiones | 155 × 235 × 16 mm · 530 g |
| Lengua | Francés |
| Editor | Ishihara, Sumio |
| Editor | Murakami, Youichi |