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X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences Softcover reprint of the original 1st ed. 2015 edition
X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences
Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
377 pages, 99 black & white illustrations, 86 colour illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 23 de agosto de 2016 |
| ISBN13 | 9783662522127 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 361 |
| Dimensiones | 155 × 235 × 20 mm · 530 g |
| Lengua | Alemán |
| Editor | Ridgway, Mark C. |
| Editor | Schnohr, Claudia S. |