Recomienda este artículo a tus amigos:
Ellipsometry at the Nanoscale Softcover reprint of the original 1st ed. 2013 edition
Ellipsometry at the Nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials.
730 pages, XXIV, 730 p.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 23 de agosto de 2016 |
| ISBN13 | 9783662519714 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 730 |
| Dimensiones | 150 × 220 × 10 mm · 1,04 kg |
| Lengua | Alemán |
| Editor | Hingerl, Kurt |
| Editor | Losurdo, Maria |