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X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences Claudia Schnohr 2015 edition
X-Ray Absorption Spectroscopy of Semiconductors - Springer Series in Optical Sciences
Claudia Schnohr
Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
361 pages, 99 black & white illustrations, 86 colour illustrations, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 17 de noviembre de 2014 |
| ISBN13 | 9783662443613 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Género | Aspects (Academic) > Science / Technology Aspects |
| Páginas | 361 |
| Dimensiones | 240 × 161 × 23 mm · 707 g |
| Lengua | Francés |
| Editor | Ridgway, Mark C. |
| Editor | Schnohr, Claudia S. |