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Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics Andreas Rosenauer Softcover reprint of the original 1st ed. 2003 edition
Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics
Andreas Rosenauer
This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.
253 pages, 186 black & white illustrations, 47 colour illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 20 de noviembre de 2013 |
| ISBN13 | 9783662146187 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 241 |
| Dimensiones | 155 × 235 × 14 mm · 362 g |
| Lengua | Alemán |