Guy Lelay
Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987 - Springer Proceedings in Physics Guy Lelay Softcover Reprint of the Original 1st 1987 edition

Name: Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987 - Springer Proceedings in Physics
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Author: Guy Lelay

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Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987 - Springer Proceedings in Physics

Guy Lelay

Softcover Reprint of the Original 1st 1987 edition

(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.

408 pages, biography

Medios de comunicación	Libros Paperback Book (Libro con tapa blanda y lomo encolado)
Publicado	6 de diciembre de 2011
ISBN13	9783642729690
Editores	Springer-Verlag Berlin and Heidelberg Gm
Páginas	389
Dimensiones	173 × 245 × 21 mm · 648 g
Lengua	Alemán
Editor	Boccara, Nino
Editor	Derrien, Jacques
Editor	LeLay, Guy