Surface Passivation of Crystalline Silicon Using Amorphous Silicon: an Evaluation by Photocarrier Radiometry (Pcr) - Keith Leong - Libros - VDM Verlag - 9783639023534 - 13 de junio de 2008
En caso de que portada y título no coincidan, el título será el correcto

Surface Passivation of Crystalline Silicon Using Amorphous Silicon: an Evaluation by Photocarrier Radiometry (Pcr)

Precio
$ 57,49
sin IVA

Pedido desde almacén remoto

Entrega prevista 17 de jun. - 6 de jul.
Añadir a tu lista de deseos de iMusic

The Suns light rays continuously strike the Earth's surface and could provide ten times the amount of electricity society consumes. This represents an untapped natural resource that is only now being harvested. Photovoltaics (solar cell) is the field that strives to develop this energy resource. Typical polysilicon (multi-crystalline) solar modules have efficiencies around 14%. To improve efficiencies and reduce costs the exploration of new structures has been undertaken. High efficiency photovoltaic devices can be produced using a novel all silicon heterostructure. This book attempts to explore the passivation of the crystalline silicon (c-Si) surface with hydrogenated amorphous silicon films (a-Si: H). The critical parameter in determining the quality of passivation is the effective minority carrier lifetime of the c-Si/a-Si: H heterostructure. These lifetime measurements were performed with the novel, all optical, Photocarrier Radiometry (PCR) technique. This book is intended for those who are pursuing technological applications in c-Si/a-Si: H heterostructures, as well as to those in the PV field in dealing with surface passivation and lifetime measurements.

Medios de comunicación Libros     Paperback Book   (Libro con tapa blanda y lomo encolado)
Publicado 13 de junio de 2008
ISBN13 9783639023534
Editores VDM Verlag
Páginas 88
Dimensiones 150 × 220 × 10 mm   ·   127 g
Lengua Inglés  

Mere med samme udgiver