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Gettering Defects in Semiconductors - Springer Series in Advanced Microelectronics Victor A. Perevostchikov 2005 edition
Gettering Defects in Semiconductors - Springer Series in Advanced Microelectronics
Victor A. Perevostchikov
Systematizes the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics. This book describes contemporary trends in gettering technologies from an international perspective. It also discusses the types and properties of structural defects in semiconductors.
388 pages, 70 black & white illustrations, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 15 de septiembre de 2005 |
| ISBN13 | 9783540262442 |
| Editores | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 388 |
| Dimensiones | 155 × 235 × 23 mm · 739 g |
| Lengua | Inglés |
| Traductor | Gloumov, Victor |