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Metrology and Standardization for Nanotechnology: Protocols and Industrial Innovations - Applications of Nanotechnology E Mansfield
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Metrology and Standardization for Nanotechnology: Protocols and Industrial Innovations - Applications of Nanotechnology
E Mansfield
Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.
626 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 8 de febrero de 2017 |
| ISBN13 | 9783527340392 |
| Editores | Wiley-VCH Verlag GmbH |
| Páginas | 626 |
| Dimensiones | 178 × 251 × 35 mm · 1,43 kg |
| Editor | Fujita, Daisuke (National Institute for Materials Science (NIMS), Tsukuba, Japan; University of Tokyo, Japan) |
| Editor | Kaiser, Debra L. (National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA; Massachusetts Institute of Technology (MIT)) |
| Editor | Mansfield, Elisabeth (National Institute of Standards and Technology (NIST), Boulder, CO, USA; University of Arizona, Tucson, USA) |
| Editor | Van de Voorde, Marcel (University of Technology, Delft, Netherland) |
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