Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications - G Friedbacher - Libros - Wiley-VCH Verlag GmbH - 9783527320479 - 20 de abril de 2011
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Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications 2nd, Completely Revised and Enlarged edition

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Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.


558 pages, Illustrations

Medios de comunicación Libros     Hardcover Book   (Libro con lomo y cubierta duros)
Publicado 20 de abril de 2011
ISBN13 9783527320479
Editores Wiley-VCH Verlag GmbH
Páginas 558
Dimensiones 248 × 182 × 31 mm   ·   1,19 kg
Lengua Inglés  
Editor Bubert, Henning (Institute of Spectrochemistry and Applied Spectroscopy, Dortmund, Germany)
Editor Friedbacher, Gernot (Vienna University of Technology, Vienna, Austria)

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