Recomienda este artículo a tus amigos:
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications G Friedbacher 2nd, Completely Revised and Enlarged edition
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
G Friedbacher
Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
558 pages, Illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 20 de abril de 2011 |
| ISBN13 | 9783527320479 |
| Editores | Wiley-VCH Verlag GmbH |
| Páginas | 558 |
| Dimensiones | 248 × 182 × 31 mm · 1,19 kg |
| Lengua | Inglés |
| Editor | Bubert, Henning (Institute of Spectrochemistry and Applied Spectroscopy, Dortmund, Germany) |
| Editor | Friedbacher, Gernot (Vienna University of Technology, Vienna, Austria) |