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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science Cor Claeys 1st ed. 2018 edition
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact - Springer Series in Materials Science
Cor Claeys
material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
438 pages, 207 Illustrations, color; 8 Illustrations, black and white; XXXIII, 438 p. 215 illus., 20
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 22 de agosto de 2018 |
| ISBN13 | 9783319939247 |
| Editores | Springer International Publishing AG |
| Páginas | 438 |
| Dimensiones | 150 × 220 × 20 mm · 834 g |
| Lengua | Francés |
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