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Multi-run Memory Tests for Pattern Sensitive Faults Ireneusz Mrozek 1st ed. 2019 edition
Multi-run Memory Tests for Pattern Sensitive Faults
Ireneusz Mrozek
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.
135 pages, 50 Tables, color; 34 Illustrations, black and white; X, 135 p. 34 illus.
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 18 de julio de 2018 |
| ISBN13 | 9783319912035 |
| Editores | Springer International Publishing AG |
| Páginas | 135 |
| Dimensiones | 150 × 220 × 20 mm · 454 g |
| Lengua | Francés |