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Contactless VLSI Measurement and Testing Techniques Selahattin Sayil Softcover reprint of the original 1st ed. 2018 edition
Contactless VLSI Measurement and Testing Techniques
Selahattin Sayil
The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.
93 pages, 11 Illustrations, color; 23 Illustrations, black and white; V, 93 p. 34 illus., 11 illus.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 4 de septiembre de 2018 |
| ISBN13 | 9783319888194 |
| Editores | Springer International Publishing AG |
| Páginas | 93 |
| Dimensiones | 150 × 220 × 10 mm · 184 g |
| Lengua | Alemán |
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