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Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering Xiao Liu Softcover reprint of the original 1st ed. 2014 edition
Trace-Based Post-Silicon Validation for VLSI Circuits - Lecture Notes in Electrical Engineering
Xiao Liu
This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.
123 pages, 21 black & white illustrations, 38 colour illustrations, 18 black & white tables, biograp
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 23 de agosto de 2016 |
| ISBN13 | 9783319375946 |
| Editores | Springer International Publishing AG |
| Páginas | 108 |
| Dimensiones | 155 × 235 × 7 mm · 185 g |
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