Recomienda este artículo a tus amigos:
X-Ray Structure Analysis Theo Siegrist
X-Ray Structure Analysis
Theo Siegrist
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 22 de noviembre de 2021 |
| ISBN13 | 9783110610703 |
| Editores | De Gruyter |
| Páginas | 250 |
| Dimensiones | 170 × 240 × 13 mm · 498 g |
| Lengua | Inglés |