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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers - Communications in Computer and Information Science 1st ed. 2022 edition
VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers - Communications in Computer and Information Science
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions.
596 pages, 316 Illustrations, color; 94 Illustrations, black and white; XVIII, 596 p. 410 illus., 31
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 17 de diciembre de 2022 |
| ISBN13 | 9783031215131 |
| Editores | Springer International Publishing AG |
| Páginas | 596 |
| Dimensiones | 150 × 220 × 10 mm · 932 g |
| Lengua | Alemán |
| Editor | Darji, Anand |
| Editor | Dasgupta, Sudeb |
| Editor | Shah, Ambika Prasad |
| Editor | Tudu, Jaynarayan |