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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques Sebastian Huhn 2021 edition
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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques
Sebastian Huhn
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
164 pages, 75 Tables, color; 25 Illustrations, color; 22 Illustrations, black and white; XXI, 164 p.
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 20 de abril de 2022 |
| ISBN13 | 9783030692117 |
| Editores | Springer Nature Switzerland AG |
| Páginas | 164 |
| Dimensiones | 150 × 220 × 10 mm · 296 g |
| Lengua | Alemán |
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