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X-ray Scattering From Semiconductors (2nd Edition) Fewster, Paul F (Panalytical Research, Uk) 2 Revised edition
X-ray Scattering From Semiconductors (2nd Edition)
Fewster, Paul F (Panalytical Research, Uk)
A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.
316 pages, Illustrations
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 8 de julio de 2003 |
| ISBN13 | 9781860943607 |
| Editores | Imperial College Press |
| Páginas | 316 |
| Dimensiones | 154 × 230 × 24 mm · 666 g |
| Lengua | Inglés |