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Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes Edmund G. Seebauer 2009 edition
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes
Edmund G. Seebauer
"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
298 pages, 30 black & white tables, biography
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 1 de diciembre de 2008 |
| ISBN13 | 9781848820586 |
| Editores | Springer London Ltd |
| Páginas | 298 |
| Dimensiones | 155 × 235 × 25 mm · 635 g |
| Lengua | Inglés |