Recomienda este artículo a tus amigos:
Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices
Precio
$ 157,99
sin IVA
Pedido desde almacén remoto
Entrega prevista 17 de jun. - 6 de jul.
Nuestros clientes opinan:
Añadir a tu lista de deseos de iMusic
Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices
This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.
596 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 16 de diciembre de 2019 |
| ISBN13 | 9781785616556 |
| Editores | Institution of Engineering and Technolog |
| Páginas | 596 |
| Dimensiones | 150 × 220 × 20 mm · 1,09 kg |
| Editor | Tuomisto, Filip (Professor, University of Helsinki, Department of Physics, Finland) |
