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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) 2.º edición
Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
350 pages
| Medios de comunicación | Libros Hardcover Book (Libro con lomo y cubierta duros) |
| Publicado | 18 de mayo de 2015 |
| ISBN13 | 9781783265282 |
| Editores | Imperial College Press |
| Páginas | 432 |
| Dimensiones | 160 × 238 × 23 mm · 802 g |
| Lengua | Inglés |