Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings -  - Libros - Materials Research Society - 9781558992818 - 16 de octubre de 1995
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Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings

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Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities.


1054 pages

Medios de comunicación Libros     Hardcover Book   (Libro con lomo y cubierta duros)
Publicado 16 de octubre de 1995
ISBN13 9781558992818
Editores Materials Research Society
Páginas 1082
Dimensiones 160 × 237 × 62 mm   ·   1,70 kg
Lengua Inglés  
Editor Akasaki, I. (Meijo University, Japan)
Editor Ashok, S. (Pennsylvania State University)
Editor Chevallier, J.
Editor Johnson, N. M. (Xerox Palo Alto Research Center, Stanford University, California)
Editor Sopori, B. L. (National Renewable Energy Laboratory, Golden, Colorado)

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