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Point and Extended Defects in Semiconductors - NATO Science Series B Giorgio Benedek Softcover reprint of the original 1st ed. 1989 edition
Point and Extended Defects in Semiconductors - NATO Science Series B
Giorgio Benedek
The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.
300 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 16 de abril de 2013 |
| ISBN13 | 9781468457117 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 287 |
| Dimensiones | 178 × 254 × 15 mm · 521 g |
| Lengua | Inglés |
| Editor | Benedek, Giorgio |
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