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Defect and Fault Tolerance in VLSI Systems: Volume 1 Israel Koren Softcover reprint of the original 1st ed. 1989 edition
Defect and Fault Tolerance in VLSI Systems: Volume 1
Israel Koren
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts.
362 pages, 96 black & white illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 12 de junio de 2012 |
| ISBN13 | 9781461568018 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 362 |
| Dimensiones | 178 × 254 × 19 mm · 657 g |
| Lengua | Inglés |