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Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials David C. Joy 2013 edition
Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials
David C. Joy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.
72 pages, 13 black & white illustrations, 16 colour illustrations, 2 black & white tables, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 14 de septiembre de 2013 |
| ISBN13 | 9781461486596 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 64 |
| Dimensiones | 155 × 235 × 8 mm · 158 g |
| Lengua | Inglés |