Recomienda este artículo a tus amigos:
Advances in X-Ray Analysis: Volume 25 John C Russ Softcover reprint of the original 1st ed. 1982 edition
Advances in X-Ray Analysis: Volume 25
John C Russ
In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction.
398 pages, 104 black & white illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 24 de julio de 2012 |
| ISBN13 | 9781461399957 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 398 |
| Dimensiones | 170 × 244 × 22 mm · 666 g |
| Lengua | Inglés |
| Editor | Russ, John C. |
Mas por John C Russ
Mostrar todoMere med samme udgiver
Ver todo de John C Russ ( Ej. Paperback Book )