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Advances in X-Ray Analysis: Volume 22 Gregory J Mccarthy Softcover reprint of the original 1st ed. 1979 edition
Advances in X-Ray Analysis: Volume 22
Gregory J Mccarthy
In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.
492 pages, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 12 de diciembre de 2012 |
| ISBN13 | 9781461399896 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 492 |
| Dimensiones | 170 × 244 × 26 mm · 807 g |
| Lengua | Inglés |
| Editor | McCarthy, Gregory J. |
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