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Advances in X-ray Analysis: Volume 20 Mcmurdie Softcover reprint of the original 1st ed. 1977 edition
Advances in X-ray Analysis: Volume 20
Mcmurdie
X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment.
621 pages, 171 black & white illustrations, biography
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 12 de diciembre de 2012 |
| ISBN13 | 9781461399834 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 604 |
| Dimensiones | 178 × 254 × 32 mm · 1,07 kg |
| Lengua | Inglés |
| Editor | McMurdie, Howard |