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Advances in X-Ray Analysis: Volume 28 Charles S Barrett Softcover reprint of the original 1st ed. 1985 edition
Advances in X-Ray Analysis: Volume 28
Charles S Barrett
The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics.
408 pages, black & white illustrations
| Medios de comunicación | Libros Paperback Book (Libro con tapa blanda y lomo encolado) |
| Publicado | 4 de octubre de 2011 |
| ISBN13 | 9781461294993 |
| Editores | Springer-Verlag New York Inc. |
| Páginas | 408 |
| Dimensiones | 178 × 254 × 21 mm · 712 g |
| Lengua | Inglés |
| Editor | Barrett, Charles S. |
| Editor | Predecki, Paul K. |
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